3701:1-46-45 Prototype tests for luminous safety devices for use in aircraft.

 

 

 

3701: 1- 46- 45             Prototype tests for lum inous safety devices for use in aircraft.

 

 

An applicant for a license pursuant to rule 3701: 1- 46- 33 of the Adm inistrative Code shall conduct prototype tests on each of five prototype lum inous safety devices for use in aircraft as follows:

 

(A)    )  Tem perature- alt it ude  test.  The  device  shall  be  placed  in  a  test  cham ber  as  it would  be  used  in  service.  A  tem perature- alt it ude  condition  schedule  shall  be followed as outlined in table 1:

 

- Table 1 - Tem perature- alt it ude test-

Step 1	The internal tem perature of the test cham ber shall be reduced to - 62º C ( - 80º F) and the device shall be m aintained for at least one hour at this tem perature at atm ospheric pressure.
Step 2	The internal tem perature of the test cham ber shall be raised to - 54º C ( - 65º F) and m aintained until the tem perature of the device has stabilized at - 54º C ( - 65º F) at atm ospheric pressure.
Step 3	The atm ospheric pressure of the cham ber shall be reduced to eighty- three m illim eters of m ercury absolute pressure while the cham ber tem perature is m aintained at - 54º C ( - 65º F).
Step 4	The internal tem perature of the cham ber shall be raised to - 10º C ( 14º F) and m aintained until the tem perature of the device has stabilized at - 10º C ( 14º F), and the internal pressure of the cham ber shall then be adjusted to atm ospheric pressure. The test cham ber door shall then be opened in order that frost will form on the device, and shall rem ain open until the frost has m elted but not long enough to allow the m oisture to evaporate. The door shall then be closed.
Step 5	The internal tem perature of the cham ber shall be raised to 85º C ( 185º F) at atm ospheric pressure. The tem perature of the device shall be stabilized at 85º C ( 185º F) and m aintained for two hours. The device shall then be visually inspected to determ ine the extent of any deterioration.
Step 6	The cham ber tem perature shall be reduced to 71º C ( 160º F) at atm ospheric pressure. The tem perature of the device shall be stabilized at 71º C ( 160º F) for a period of thirty m inutes.
Step 7	The cham ber tem perature shall be reduced to 55º C ( 130º F) at atm ospheric pressure. The tem perature of the device shall be stabilized at this tem perature for a period of four hours.
Step 8	The internal tem perature of the cham ber shall be reduced to 30º C ( 86º F) and the pressure to one hundred thirty- eight m illim eters of m ercury absolute pressure and stabilized. The device shall be m aintained under these conditions for a period of four hours.
Step 9	The tem perature of the test cham ber shall be raised to 35º C ( 95º F) and the pressure reduced to eighty- three m illim eters of m ercury absolute pressure and stabilized. The device shall be m aintained under these conditions for a period of thirty m inutes.
Step 10	The internal pressure of the cham ber shall be m aintained at eighty- three m illim eters of m ercury absolute pressure and the tem perature reduced to 20º C ( 68º F) and stabilized. The device shall be m aintained under these conditions for a period of four hours.

 

 

 

 

 

 

(B)  ) Vibration tests. This procedure applies to it em s of equipm ent ( including  vibration isolating assem blies) intended to be m ounted directly on the structure  of aircraft powered by reciprocating, turbojet, or turbo- propeller engines or to be  m ounted directly on gas- turbine engines. The device shall be m ounted on an  apparatus dynam ically sim ilar to the m ost severe conditions likely to be  encountered  in norm al   use.   At   the   end   of   the   test   period,   the   device   shall be inspected thoroughly for possible dam age. Vibration tests shall be  conducted under both resonant and cycling conditions according to the following  vibration test schedule ( table 2)

- Table 2 - Vibration test schedule ( t im es shown refer to one axis of vibration)-

Type	Vibration at room tem perature ( m inutes)	Vibration  at 71º C ( 160º F) ( m inutes)	Vibration  at - 54º C ( - 65º F) ( m inutes)
Resonance	60	15	15
Cycling	60	15	15

(1)   )   Determ ination   of   resonance   frequency.   I ndividual   resonance   frequency surveys shall be conducted by applying vibration to each device  along each of any set of three m utually perpendicular axes and varying the frequency of applied vibration slowly through a range of frequencies from  five cycles per second to five hundred cycles per  second with  the double  am plitude of the vibration not exceeding that shown in figure 1 for the related frequency.

(2)   )  Resonance tests. The device shall be vibrated at  the determ ined  resonance frequency   for   each   axis  of   vibration   for   the   periods   and   tem perature conditions shown in table 1 and with the applied double am plitude specified in  figure  1  for  that  resonance  frequency.  When  m ore  than  one  resonant frequency is encountered with vibration applied along  any one axis, the test

period m ay  be  accom plished  at  the  m ost  severe  resonance  or  the  period m ay be divided  am ong  the  resonant  frequencies,  whichever  is  considered m ost likely to produce failure. When resonant frequencies are not  apparent within the specified frequency range, the specim en shall be vibrated for periods twice as long as those shown for resonance in table 2 at a frequency of fift y- five cycles per second and an applied  double  am plitude  of  0.060 inch.

(3)    ) Cycling. Devices to be m ounted only on vibration isolators shall be tested  by applying vibration  along  each  of  three  m utually  perpendicular  axes of  the device with an applied  double  am plitude  of  0.060  inch  and  the  frequency cycling between ten and fifty- five cycles per second in one m inute  cycles for the periods  and  tem perature  conditions  shown  in  table  2.  Devices  to  be installed  in  aircraft  without  vibration  isolators  shall  be  tested  by  applying vibration along each of three m utually perpendicular  axes of the device with an applied double am plitude of 0.036 inch or an  applied acceleration of ten G, whichever is the lim it ing value, and the  frequency  cycling  between  ten and five hundred cycles per second in fift een  m inute cycles for  the periods and tem perature conditions shown in  table 2.

(C)   )  Accelerated  weathering  tests.  The  device  shall  be  subjected  to  one  hundred hours of accelerated weathering in a suitable  weathering  m achine.   Panels  of Corex  D glass shall surround the arc to cut  off the ultraviolet  radiation below a wave length of two thousand seven hundred angstrom s. The  light of the carbon arcs shall fall directly on the face of the device. The tem perature at  the sam ple shall be m aintained at  fift y degrees celsius plus or m inus three degrees celsius. Tem perature m easurem ents shall be m ade with a black panel therm om eter.

(D)  )  Shock  test.  The  device  shall  be  dropped  upon  a  concrete  or  iron  surface  in  a three foot free gravitational fall, or shall be subjected to equivalent t reatm ent  in a  test  device  sim ulating  such  a  free  fall.  The  drop  test  shall  be  repeated  one hundred t im es from random orientations.

(E)  ) Herm et ic seal and waterproof test. On com pletion of all other tests prescribed  by this section, the device shall be im m ersed in thirty  inches of water for  twenty- four hours and shall show no visible evidence of water entry. Absolute  pressure of the air above the water shall then be reduced to one inch of m ercury.  Lowered pressure  shall  be  m aintained  for  one  m inute  or  until  air  bubbles  cease to  be given off by the water, whichever is the longer. Pressure shall then  be increased to norm al atm ospheric pressure. Any evidence of bubbles em anating from within the device, or water entering the device, shall be considered  leakage.

(F)    ) Observations. After each of the tests prescribed by this rule, each device shall  be exam ined   for   evidence   of   physical   dam age   and   for   loss   of   t r it ium    or prom ethium - 147.  Any  evidence  of  dam age  to  or  failure  of  any  device  which could  affect  containm ent  of  the  t rit ium  or  prom ethium - 147  shall  be  cause for rejection of the design if the dam age or failure is attributable to a  design defect. Loss of t r it ium or prom ethium - 147 from each tested device shall be m easured by wiping with filt er paper an area of at least one hundred square  centim eters on the outside surface of the device, or by wiping the entire surface area if it is less than one hundred square centim eters. The am ount of t r it ium or  prom ethium - 147 in  the  water   used  in  the  herm et ic  seal  and  waterproof   test prescribed by paragraph ( E) of this rule shall also be m easured. Measurem ents shall be m ade

in an apparatus calibrated to m easure t r it ium or prom ethium - 147, as appropriate. The detection on the filt er paper of m ore than two thousand two hundred disintegrations per m inute of t r it ium or  prom ethium - 147  per  one hundred square centim eters of surface wiped or in the water of m ore than 0. 1 per cent of the original am ount of t r it ium or prom ethium - 147 in any device shall be cause for rejection of the tested device.

Effective:	11/08/2015
Five Year Review (FYR) Dates:	08/24/2015
CERTIFIED ELECTRONICALLY
Certification
10/29/2015
Date
Promulgated Under:	119.03
Statutory Authority:	3748.04
Rule Amplifies:	3748.04
Prior Effective Dates:	10/20/2002, 6/20/03, 1/20/08